NDLI: A nonparametric nonstationary procedure for failure prediction

Content Provider	IEEE Xplore Digital Library
Author	Pfefferman, J.D. Cernuschi-Frias, B.
Copyright Year	1963
Abstract	The time between failures is a very useful measurement to analyze reliability models for time-dependent systems. In many cases, the failure-generation process is assumed to be stationary, even though the process changes its statistics as time elapses. This paper presents a new estimation procedure for the probabilities of failures; it is based on estimating time-between-failures. The main characteristics of this procedure are that no probability distribution function is assumed for the failure process, and that the failure process is not assumed to be stationary. The model classifies the failures in Q different types, and estimates the probability of each type of failure s-independently from the others. This method does not use histogram techniques to estimate the probabilities of occurrence of each failure-type; rather it estimates the probabilities directly from the values of the time-instants at which the failures occur. The method assumes quasistationarity only in the interval of time between the last 2 occurrences of the same failure-type. An inherent characteristic of this method is that it assigns different sizes for the time-windows used to estimate the probabilities of each failure-type. For the failure-types with low probability, the estimator uses wide windows, while for those with high probability the estimator uses narrow windows. As an example, the model is applied to software reliability data.
Sponsorship	IEEE Reliability Society
Starting Page	434
Ending Page	442
Page Count	9
File Size	757308
File Format	PDF
ISSN	00189529
Volume Number	51
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Failure analysis Predictive models Probability distribution Software reliability Time measurement Statistical distributions Histograms Probability density function Random variables Testing
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Statistical Distributions in Reliability

Optimal prediction-intervals for the exponential distribution, based on generalized order statistics

Probability Limits for Life Test Data

Bayes predictive analysis of a fundamental software reliability model

A type-II censored, log test time based, component-testing procedure for a parallel system

Limited failure-censored life test for the Weibull distribution

Failure correlation in software reliability models

Maximum Entropy and Reliability Distributions

Prediction intervals, based on ranges and waiting times, for an exponential distribution

A nonparametric nonstationary procedure for failure prediction

Similar Documents

Statistical Distributions in Reliability

Optimal prediction-intervals for the exponential distribution, based on generalized order statistics

Probability Limits for Life Test Data

Bayes predictive analysis of a fundamental software reliability model

A type-II censored, log test time based, component-testing procedure for a parallel system

Limited failure-censored life test for the Weibull distribution

Failure correlation in software reliability models

Maximum Entropy and Reliability Distributions

Prediction intervals, based on ranges and waiting times, for an exponential distribution

A nonparametric nonstationary procedure for failure prediction