NDLI: A new reliability test for multilayer ceramic capacitors

Content Provider	IEEE Xplore Digital Library
Author	Ingalls, M.W.
Copyright Year	1994
Abstract	Several reliability problems related to insulation resistance (IR) have been reported by multilayer ceramic capacitor ((MLC) users over the years: IR degradation over time at less than rated voltage (low voltage leakage), unsteady dissipation factor with bias applied, partial recovery of IR after repeated application of high voltage, and IR degradation of MLC's taken from sealed bags in inventory. Current test procedures, as in Mil-C-55681, designed to replicate the particular conditions related to MLC failure cannot effectively separate the root causes of these failures because causal mechanisms are confounded. Although in their entirety they do effectively expose weak lots, their application to commercial lots is cost prohibitive. An alternate test procedure designed to rapidly, effectively, and economically detect the separate root causes of MLC failures is presented. The test procedure focuses on finding the causal defects rather than attempting to reproduce and measure the individual failure mechanisms themselves. An analog megohmmeter and an oven or hot plate are the only equipment necessary for conducting the procedure, making it a good tool for users as well as capacitor suppliers. The premise that electrical stress and thermal stress on MLC's are linearly independent, and therefore separable, is presented. The separable effects of steady-state voltage and thermal/mechanical stress are applied to the study of MLC failures in this paper. Data are presented comparing the effectiveness of the test procedure to 25/spl deg/C bias voltage testing, conventional voltage conditioning, and highly accelerated life test (HALT).<>
Sponsorship	Ericsson IEEE Components, Packaging and Manufacturing Technology Society
Starting Page	344
Ending Page	347
Page Count	4
File Size	388909
File Format	PDF
ISSN	10709886
Volume Number	17
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-09-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Nonhomogeneous media Ceramics Capacitors Thermal stresses Life testing Degradation Low voltage Insulation Costs Failure analysis
Content Type	Text
Resource Type	Article
Subject	Engineering

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