NDLI: Experimental requirements for the measurement of excess carrier lifetime in semiconductors using microwave techniques

Content Provider	IEEE Xplore Digital Library
Author	Wang, M.S. Borrego, J.M.
Copyright Year	1963
Abstract	Experimental requirements for an accurate evaluation of the excess carriers lifetime in semiconductors using nondestructive microwave reflection techniques are presented. A relationship between the observed exponential decay time constant and the excess carrier lifetime is derived. It is shown that the microwave transient decay time constant could be either the lifetime or half of the lifetime depending on the arrangement of the measurement setup. The theory of the lifetime measurement has been corroborated by the microwave measurements taken on silicon and semiinsulating gallium arsenide (Si-GaAs) wafers and by an independent photovoltage decay method on silicon solar cells.<>
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1054
Ending Page	1058
Page Count	5
File Size	458924
File Format	PDF
ISSN	00189456
Volume Number	39
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Charge carrier lifetime Microwave integrated circuits Microwave measurements Optical reflection Silicon Power measurement Time measurement Microwave theory and techniques Gallium arsenide Photovoltaic cells
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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