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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zoughi, R. Bakhtiari, S. |
| Copyright Year | 1963 |
| Abstract | A microwave nondestructive technique for the detection and evaluation of disbonding and delamination in layered-dielectric-slabs backed by a conducting plate is discussed. The theoretical development of the technique is given. An incident wave illuminating such a medium is first considered, and the characteristics of the wave reflected by the metal plate are then formulated. An effective reflection coefficient whose phase characteristics are used in the detection and evaluation of delaminations in the media is determined in this way. The characteristics of this phase as a function of several parameters, such as delamination dielectric constant and thickness, slab dielectric constant, and thickness and the frequency of operation are investigated. The experimental apparatus is described. It was used to perform several experiments to test and verify the theory. Very good agreement was obtained between the theoretical and experimental results. In general, it was concluded that higher frequencies, thicker dielectric plates, and lower values of delamination dielectric constants tend to produce better results for evaluating the nature of a delaminated layer. This technique is simple and easily applicable to environments where these types of layered-slab are used.< |
| Sponsorship | IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc |
| Starting Page | 1059 |
| Ending Page | 1063 |
| Page Count | 5 |
| File Size | 394676 |
| File Format | |
| ISSN | 00189456 |
| Volume Number | 39 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Delamination Slabs Reflection Dielectric materials Dielectric constant Permittivity Microwave theory and techniques Aerospace materials Building materials Conducting materials |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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