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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Clark, L.T. Grondin, R.O. |
| Copyright Year | 1966 |
| Abstract | A memory system which rapidly chooses the stored item most closely matching a given input is fundamental to a number of recognition tasks. A memory architecture which performs this function is discussed. In addition, a measure of the quality of the selected (best matching) memory is generated. The architecture is capable of significant data throughput rates and is amenable to implementation using conventional digital VLSI fabrication process. These characteristics are demonstrated by a prototype device fabricated using the MOSIS 3- mu m CMOS design rules, which can compare more than two million 9-bit input works per second. Behavioral simulations demonstrate the applicability of the architecture to some basic recognition tasks.< |
| Sponsorship | IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE |
| Starting Page | 28 |
| Ending Page | 34 |
| Page Count | 7 |
| File Size | 799363 |
| File Format | |
| ISSN | 00189200 |
| Volume Number | 24 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1989-02-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Very large scale integration Computer aided manufacturing CADCAM Fabrication Random access memory Impedance matching Computer architecture Mathematical model Artificial neural networks Circuits |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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