NDLI: Radiation Response of Advanced Dynamic Random Access Memories (DRAMs)

Content Provider	IEEE Xplore Digital Library
Author	Witteles, A. A. Volmerange, H.
Copyright Year	1963
Abstract	The radiation response of ten types of NMOS dynamic RAMs (DRAMs) was studied in a total dose and prompt dose rate environment. The test ensemble represented a cross section of state-of-the-art advanced semiconductor memories presently available off the shelf from five vendors and included eight types of 64K DRAMs and two types of 16K DRAMs. Samples were drawn from fourteen different date codes covering a span of more than one year. The observed dose to failure level was generally higher than earlier DRAM memories but is still only comparable to the dose specified for systems with moderate requirements. Functional upset occurred within the typical range for upset of other semiconductor technologies. The relatively large dispersion in vendor-to-vendor hardness data points to the need for hardness assurance controls by the user.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	1665
Ending Page	1668
Page Count	4
File Size	670797
File Format	PDF
ISSN	00189499
Volume Number	29
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1982-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	DRAM chips Random access memory Logic devices MOS devices Semiconductor memory Semiconductor device testing Magnetic cores Costs Performance evaluation Instruments
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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