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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Nunnally, Curtis |
| Copyright Year | 1963 |
| Abstract | A small computer system for testing digitizers, control cards, and backplanes was developed at the Lawrence Berkeley Lab to be used in the Time Projection Chamber (TPC) Detector. The objective of this development was to provide a low cost test system for fast debugging, maintenance, a quality control by outside vendors who fabricated these units as well as Laboratory personnel. When the system was delivered to the vendors, it consisted of the computer programming and documentation necessary to do a complete checkout of approximately 20,000 signal channels. To obtain this low cost system (totaling $1400) a commercial microcomputer with 16K of memory and a printer (40 characters per line, 30 characters per second) were selected. This paper describes the overall test system and programming features including the linking capabiliities of the "debug" program. It, also, describes the various interfacing techniques that were used to obtain hardcopies. |
| Sponsorship | IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD |
| Starting Page | 395 |
| Ending Page | 399 |
| Page Count | 5 |
| File Size | 609371 |
| File Format | |
| ISSN | 00189499 |
| Volume Number | 28 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1981-02-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | System testing Microcomputers Costs Control systems Backplanes Detectors Debugging Quality control Laboratories Personnel |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering |
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