NDLI: Increasing Quantitation Accuracy of Fluorescent Excitation Analysis (Fea) Systems by Pulse Rise-Time Discrimination

Content Provider	IEEE Xplore Digital Library
Author	Arbel, Arie Kaufman, Leon
Copyright Year	1963
Abstract	The quantitation accuracy of FEA systems is dependent on the characteristic x-ray to background ratio. This background appears as a continuum of energy lower than the primary Compton scatter peak (PCSP) from the sample being assayed. In a well designed FEA system most of this low energy background does not arise from multiple Compton scatter in the sample or collimators. Rather, it results from interaction between the PCSP and the Si(Li) detector system. Although guard-ring anticoincidence or narrow collimation help to reduce background, in a good detector edge field effects play a small role, and background appears to be a volume effect. Polarized FEA has been shown to improve quantitation by reducing the PCSP to characteristic x-ray ratio, but the basic detector problem remains. We describe a pulse risetime discrimination scheme whereby slow pulses arising in the detector are discarded. For FEA of iodine with Am-241, this addition to the system produces a halving of background with a minimal impact (1-3% loss) on count-rate of iodine K x-rays. Similar results are obtained for FEA of bromine with Cd-109.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	123
Ending Page	126
Page Count	4
File Size	843974
File Format	PDF
ISSN	00189499
Volume Number	28
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1981-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fluorescence Electromagnetic scattering Particle scattering X-ray scattering X-ray detection X-ray detectors Electrons Collimators Degradation Image analysis
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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