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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ban, E. Ikebe, Y. Nishijima, G. Awaji, S. Watanabe, K. |
| Copyright Year | 2002 |
| Abstract | The effect of Zr and Sn addition on the critical current density (Jc) and the microstructure of filamentary SmBa2Cu3Oy (Sm123) has been investigated. Samples with additions fabricated by a solution spinning method were partially melted under an atmosphere gas containing 0.1-3.0% O2. After heat-treatment, homogeneous dispersion of fine Sm2BaCuO5 (Sm211) particles was observed in the Zr-doped sample. The 0.2 at% Zr-doped Sm123 showed the depressed Jc value of 1.8 × 104 at 77 K and self-field compared with the undoped sample. From the Jc measurement in magnetic fields, Jc value higher than 103 A/cm2 at 77 K was maintained up to 8 T. On the other hand, 0.2 at% Sn-added sample showed high Jc value of 5.0 × 104 A/cm2 at 77 K and self-field, and the Jc value higher than 103 A/cm2 is maintained up to 17 T. A small amount of Sn doping was found to be effective in increasing the Jc under high magnetic field and the irreversibility field of Sm123 filaments. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 6601104 |
| Ending Page | 6601104 |
| Page Count | 1 |
| File Size | 1354801 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 22 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Doping Tin Zirconium Magnetic fields Flux pinning Microstructure Sm-Ba-Cu-O filaments Chemical metal doping critical current density magnetic field behavior |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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