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Test standard revision update: jesd57, "procedures for the measurement of single-event effects in semiconductor devices from heavy-ion irradiation"
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Lauenstein, Jean-Marie |
| Copyright Year | 2015 |
| Description | The JEDEC JESD57 test standard, Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy-Ion Irradiation, is undergoing its first revision since 1996. In this talk, we place this test standard into context with other relevant radiation test standards to show its importance for single-event effect radiation testing for space applications. We show the range of industry, government, and end-user party involvement in the revision. Finally, we highlight some of the key changes being made and discuss the trade-space in which setting standards must be made to be both useful and broadly adopted.|||||||||||| |
| File Size | 299740 |
| Page Count | 15 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20150018282 |
| Archival Resource Key | ark:/13960/t6k12360r |
| Language | English |
| Publisher Date | 2015-06-23 |
| Access Restriction | Open |
| Subject Keyword | Heavy Ion Test Standard Jedec Single-event Effect (see) Radiation Hardening Heavy Ions Ion Irradiation Semiconductor Devices Single Event Upsets Extraterrestrial Radiation Standards Electronic Equipment Tests Technology Utilization Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Presentation |
