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Method of generating x-ray diffraction data for integral detection of twin defects in super-hetero-epitaxial materials
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 2009 |
| Description | A method provides X-ray diffraction (XRD) data suitable for integral detection of a twin defect in a strained or lattice-matched epitaxial material made from components having crystal structures having symme try belonging to different space groups. The material is mounted in a n X-ray diffraction (XRD) system. In one embodiment, the XRD system's goniometer angle Omega is set equal to (Theta(sub B)-Beta) where The ta(sub B) is a Bragg angle for a designated crystal plane of the allo y that is disposed at a non-perpendicular orientation with respect to the {111) crystal plane, and Beta is the angle between the designate d crystal plane and a { 111 } crystal plane of one of the epitaxial components. The XRD system's detector angle is set equal to (Theta(su b B)+Beta). The material can be rotated through an angle of azimuthal rotation Phi about the axis aligned with the material. Using the det ector, the intensity of the X-ray diffraction is recorded at least at the angle at which the twin defect occurs. |
| File Size | 1400080 |
| Page Count | 20 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20090029949 |
| Archival Resource Key | ark:/13960/t59d1xg3c |
| Language | English |
| Publisher Date | 2009-07-07 |
| Access Restriction | Open |
| Subject Keyword | Solid-state Physics Fault Detection Goniometers Semiconductors Materials Epitaxy X Ray Diffraction Defects Crystal Structure Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Patent |
