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X-ray diffraction imaging (topography) of electroopticcrystals by synchrotron radiation
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Kuriyama, Masao Steiner, Bruce Dobbyn, Ronald C. Laor, Uri |
| Copyright Year | 1988 |
| Description | Information of special interest to crystal growers and device physicists now available from monochromatic synchrotron diffraction imaging (topography) is reviewed. Illustrations are taken from a variety of electro-optic crystals. Aspects of the detailed understanding of crystal growth processes obtainable from carefully selected samples are described. Finally, new experimental opportunities now available for exploitation are indicated. |
| File Size | 1305190 |
| Page Count | 16 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19880021043 |
| Archival Resource Key | ark:/13960/t09w5bh66 |
| Language | English |
| Publisher Date | 1988-01-01 |
| Access Restriction | Open |
| Subject Keyword | Solid-state Physics Crystal Growth Electro-optical Effect Topography X Ray Imagery Monochromatic Radiation X Ray Diffraction Synchrotron Radiation Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
