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High frequency ultrasonic characterization of sintered sic
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Generazio, Edward R. Kiser, James D. Baaklini, George Y. |
| Copyright Year | 1987 |
| Description | High frequency (60 to 160 MHz) ultrasonic nondestructive evaluation was used to characterize variations in density and microstructural constituents of sintered SiC bars. Ultrasonic characterization methods included longitudinal velocity, reflection coefficient, and precise attenuation measurements. The SiC bars were tailored to provide bulk densities ranging from 90 to 98 percent of theoretical, average grain sizes ranging from 3.0 to 12.0 microns, and average pore sizes ranging from 1.5 to 4.0 microns. Velocity correlated with specimen bulk density irrespective of specimen average grain size, average pore size, and average pore orientation. Attenuation coefficient was found to be sensitive to both density and average pore size variations, but was not affected by large differences in average grain size. |
| File Size | 6037034 |
| Page Count | 20 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19880014601 |
| Archival Resource Key | ark:/13960/t8hf2qt29 |
| Language | English |
| Publisher Date | 1987-01-01 |
| Access Restriction | Open |
| Subject Keyword | Density Mass/volume Grain Size Characterization Ultrasonic Tests Sintering Silicon Carbides Attenuation Reflection Porosity High Frequencies Microstructure Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
