NDLI: Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide

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Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide

Content Provider	NASA Technical Reports Server (NTRS)
Author	Abel, Phillip B. Baaklini, George Y.
Copyright Year	1987
Description	The capabilities were investigated of projection microfocus x-radiography, ultrasonic velocity and attenuation, and reflection scanning acoustic microscopy for characterizing silicon carbide specimens. Silicon carbide batches covered a range of densities and different microstructural characteristics. Room temperature, four point flexural strength tests were conducted. Fractography was used to identify types, sizes, and locations of fracture origins. Fracture toughness values were calculated from fracture strength and flaw characterization data. Detection capabilities of radiography and acoustic microscopy for fracture-causing flaws were evaluated. Applicability of ultrasonics for verifying material strength and toughness was examined.
File Size	8243637
Page Count	20
File Format	PDF
Alternate Webpage(s)	http://archive.org/details/NASA_NTRS_Archive_19880002724
Archival Resource Key	ark:/13960/t51g5kq0n
Language	English
Publisher Date	1987-08-01
Access Restriction	Open
Subject Keyword	Nondestructive Tests Silicon Carbides X Ray Analysis Radiography Ultrasonic Tests Bend Tests Sintering Flexural Strength Acoustic Microscopes X Ray Imagery Fracture Strength Microstructure Fractography Crack Initiation Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text
Resource Type	Technical Report

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