NDLI: Characterization of sintered sic by using nde

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Characterization of sintered sic by using nde

Content Provider	NASA Technical Reports Server (NTRS)
Author	Baaklini, George Y.
Copyright Year	1988
Description	Capabilities of projection microfocus X-radiography and of ultrasonic velocity and attenuation for characterizing silicon carbide specimens were assessed. Silicon carbide batches covered a range of densities and different microstructural characteristics. Room-temperature, four-point flexural strength tests were conducted. Fractography was used to identify types, sizes, and locations of fracture origins. Fracture toughness values were calculated from fracture strength and flaw characterization data. Detection capabilities of radiography for fracture-causing flaws were evaluated. Applicability of ultrasonics for verifying material strength and toughness was examined. Radiography proved useful in detecting high-density inclusions and isolated voids, but failed in detecting surface and subsurface agglomerates and large grains as fracture origins. Ultrasonic velocity dependency on density was evident. Attenuation dependency on density and mean pore size was clearly demonstrated. Understanding attenuation as a function of toughness was limited by shortcomings in K sub IC determination.
File Size	1974924
Page Count	13
File Format	PDF
Alternate Webpage(s)	http://archive.org/details/NASA_NTRS_Archive_19880013029
Archival Resource Key	ark:/13960/t9b61g863
Language	English
Publisher Date	1988-05-01
Access Restriction	Open
Subject Keyword	Radiography Voids Nondestructive Tests Flexural Strength Silicon Carbides Attenuation Porosity Fracture Strength Inclusions Microstructure Fractography Ultrasonic Flaw Detection Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text
Resource Type	Article

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