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Nde reliability and process control for structural ceramics
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Baaklini, G. Y. |
| Copyright Year | 1986 |
| Description | The reliability of microfocus x-radiography and scanning laser acoustic microscopy for detecting microvoids in silicon nitride and silicon carbide was statistically evaluated. Materials- and process-related parameters that influenced the statistical findings in research samples are discussed. The use of conventional x-radiography in controlling and optimizing the processing and sintering of an Si3N4-Si02-Y203 composition designated NASA 6Y is described. Radiographic evaluation and guidance helped develop uniform high-density Si3N4 modulus-of-rupture bars with improved four-point flexural strength (857, 544, and 462 MPa at room temperature, 1200 C, and 1370 C, respectively) and reduced strength scatter. |
| File Size | 934975 |
| Page Count | 17 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19870003477 |
| Archival Resource Key | ark:/13960/t8dg1mw6x |
| Language | English |
| Publisher Date | 1986-01-01 |
| Access Restriction | Open |
| Subject Keyword | X Ray Inspection Nondestructive Tests Statistical Analysis Mechanical Properties Process Control Industry Ceramics Optimization Radiography Silicon Oxides Sintering Flexural Strength Proving Silicon Nitrides Reliability Yttrium Oxides Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
