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Imaging x-ray spectrometer
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Jackson Jr., J. W. Grant, P. A. Alcorn, G. E. |
| Copyright Year | 1984 |
| Description | An X-ray spectrometer for providing imaging and energy resolution of an X-ray source is described. This spectrometer is comprised of a thick silicon wafer having an embedded matrix or grid of aluminum completely through the wafer fabricated, for example, by thermal migration. The aluminum matrix defines the walls of a rectangular array of silicon X-ray detector cells or pixels. A thermally diffused aluminum electrode is also formed centrally through each of the silicon cells with biasing means being connected to the aluminum cell walls and causes lateral charge carrier depletion between the cell walls so that incident X-ray energy causes a photoelectric reaction within the silicon producing collectible charge carriers in the form of electrons which are collected and used for imaging. |
| File Size | 468955 |
| Page Count | 5 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19840025694 |
| Archival Resource Key | ark:/13960/t6xw9849n |
| Language | English |
| Publisher Date | 1984-09-18 |
| Access Restriction | Open |
| Subject Keyword | Thermal Diffusion Semiconductor Devices Aluminum X Ray Spectroscopy Solid State Devices Electrodes X Rays Wafers Silicon Radiation Detectors Silicon X Ray Imagery Photoelectricity Arrays Spatial Resolution X Ray Sources Electrons Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Patent |
