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Sensitivity analysis of add-on price estimate for select silicon wafering technologies
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Mokashi, A. R. |
| Copyright Year | 1982 |
| Description | The cost of producing wafers from silicon ingots is a major component of the add-on price of silicon sheet. Economic analyses of the add-on price estimates and their sensitivity internal-diameter (ID) sawing, multiblade slurry (MBS) sawing and fixed-abrasive slicing technique (FAST) are presented. Interim price estimation guidelines (IPEG) are used for estimating a process add-on price. Sensitivity analysis of price is performed with respect to cost parameters such as equipment, space, direct labor, materials (blade life) and utilities, and the production parameters such as slicing rate, slices per centimeter and process yield, using a computer program specifically developed to do sensitivity analysis with IPEG. The results aid in identifying the important cost parameters and assist in deciding the direction of technology development efforts. |
| File Size | 529830 |
| Page Count | 13 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19820015791 |
| Archival Resource Key | ark:/13960/t6450hc0j |
| Language | English |
| Publisher Date | 1982-02-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Cells Economic Analysis Sensitivity Cost Estimates Wafers Machining Czochralski Method Slicing Ingots Computer Programs Production Costs Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
