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Quantitative optical scanning tests of complex microcircuits
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Erickson, J. J. |
| Copyright Year | 1980 |
| Description | An approach for the development of the optical scanner as a screening inspection instrument for microcircuits involves comparing the quantitative differences in photoresponse images and then correlating them with electrical parameter differences in test devices. The existing optical scanner was modified so that the photoresponse data could be recorded and subsequently digitized. A method was devised for applying digital image processing techniques to the digitized photoresponse data in order to quantitatively compare the data. Electrical tests were performed and photoresponse images were recorded before and following life test intervals on two groups of test devices. Correlations were made between differences or changes in the electrical parameters of the test devices. |
| File Size | 19119298 |
| Page Count | 118 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19800020137 |
| Archival Resource Key | ark:/13960/t5n922g3g |
| Language | English |
| Publisher Date | 1980-03-01 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Magnetic Tapes Nondestructive Tests Image Processing Electrical Properties Digital Techniques Optical Scanners Signal Processing Shift Registers Photoelectricity Microelectronics Laser Applications Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
