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Laser scanner for testing semiconductor chips
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Hall, T. C. |
| Copyright Year | 1973 |
| Description | Individual ''fingerprint'' signals are produced when system photoexcites chips. ''Fingerprints'' are analyzed for characteristics associated with defects, including many not visible to the naked eye. Electromagnetic radiation photogenerates free electrons and holes in semiconductor chip. These carriers produce electrical signals at terminals. Signals vary depending on what defects are present. |
| File Size | 109214 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19730000327 |
| Archival Resource Key | ark:/13960/t9s22r652 |
| Language | English |
| Publisher Date | 1973-10-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Systems Electromagnetic Radiation Nondestructive Tests Semiconductor Devices Lasers Optical Scanners Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |