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X-ray photoelectron spectroscopy study of radiofrequency-sputtered refractory compound steel interfaces
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Wheeler, D. R. Brainard, W. A. |
| Copyright Year | 1978 |
| Description | Radiofrequency sputtering was used to deposit Mo2C, Mo2B5, and MoSi2 coatings on 440C steel substrates. Both sputter etched and preoxidized substrates were used, and the films were deposited with and without a substrate bias of -300 V. The composition of the coatings was measured as a function of depth by X-ray photoelectron spectroscopy combined with argon ion etching. In the interfacial region there was evidence that bias produced a graded interface in Mo2B5 but not in Mo2C. Oxides of iron and of all film constituents except carbon were presented in all cases but the iron oxide concentration was higher and the layer thicker on the preoxidized substrates. The film and iron oxides were mixed in the MoSi2 and Mo2C films but layered in the Mo2B5 film. The presence of mixed oxides correlates with enhanced film adhesion. |
| File Size | 938966 |
| Page Count | 21 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19780012393 |
| Archival Resource Key | ark:/13960/t0gv0d739 |
| Language | English |
| Publisher Date | 1978-02-01 |
| Access Restriction | Open |
| Subject Keyword | Nonmetallic Materials Metal Coatings Refractory Materials Metal Surfaces Molybdenum Compounds X Ray Spectroscopy Solid-solid Interfaces Steels Sputtering Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
