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Deterministic broadside test generation for transition path delay faults

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Multiple Coupling Effects Oriented Path Delay Test Generation

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Statistical SDFC: A metric for evaluating test quality of small delay faults

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Transition delay fault test pattern generation considering supply voltage noise in a SOC design

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Timing-based delay test for screening small delay defects

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Dynamic Compaction for High Quality Delay Test

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Fault simulation and test generation for clock delay faults

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