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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Minjin Zhang Huawei Li Xiaowei Li |
| Copyright Year | 2008 |
| Description | Author affiliation: Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing (Minjin Zhang; Huawei Li; Xiaowei Li) |
| Abstract | We propose a two-phase test generation method to generate patterns targeting maximal path delay caused by multiple crosstalk effects. A timing analysis method based on transition map is proposed to manage the timing information of aggressor lines and victim lines in the first phase, followed by an ordinary ATPG engine with a few alterations in the second phase. This two-phase method avoids complex timing processing in ATPG algorithm. Using transition map instead of timing window in timing analysis, our method can more efficiently calculate the accumulative crosstalk-induced delay and find the sub-paths which cause maximal coupling effects. We can trade off accuracy and efficiency by controlling the size of timescale used in transition map, which makes this approach highly scalable. |
| Starting Page | 383 |
| Ending Page | 388 |
| File Size | 400089 |
| Page Count | 6 |
| File Format | |
| ISBN | 9780769531236 |
| ISSN | 10930167 |
| DOI | 10.1109/VTS.2008.9 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-04-27 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Delay effects Testing Timing Test pattern generators Crosstalk Automatic test pattern generation Information analysis Information management Engines Cause effect analysis path delay fault crosstalk delay test |
| Content Type | Text |
| Resource Type | Article |
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