NDLI: A novel methodology for robustness analysis of QCA circuits

Content Provider	ACM Digital Library
Author	Torres, Frank Sill Reis, Dayane Alfenas
Abstract	Although QCA (Quantum-dot Cellular Automata) is a promising nanotechnology to replace CMOS (Complementary Metal-Oxide-Semiconductor), it has several known reliability problems. Consequently, the design of robust QCA circuits is a mandatory step towards the consolidation of this new technology. This paper presents a novel methodology for error analysis of QCA circuits based on deterministic and random insertion of possible defects. Further features are an evaluation of circuit robustness and identification of the most susceptible design elements. Simulation results indicate the feasibility of this novel methodology and reveal starting-points for robustness improvements of known QCA structures.
Starting Page	1
Ending Page	7
Page Count	7
File Format	PDF
ISBN	9781450337632
DOI	10.1145/2800986.2800995
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2015-08-31
Publisher Place	New York
Access Restriction	Subscribed
Subject Keyword	Robustness Reliability Qca Defects modeling
Content Type	Text
Resource Type	Article

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A novel methodology for robustness analysis of QCA circuits