NDLI: Fast physics-based electromigration checking for on-die power grids

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Fast physics-based electromigration checking for on-die power grids

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Fast physics-based electromigration checking for on-die power grids

Content Provider	ACM Digital Library
Author	Sukharev, Valeriy Najm, Farid N. Chatterjee, Sandeep
Abstract	Due to technology scaling, electromigration (EM) signoff has become increasingly difficult, mainly due to the use of inaccurate methods for EM assessment, such as the empirical Black's model. In this paper, we present a novel approach for EM checking using physics-based models of EM degradation, which effectively removes the inaccuracy, with negligible impact on run-time. Our main contribution is to extend the existing physical models for EM in metal branches to track the degradation in multi-branch interconnect trees. We also propose effective filtering and predictor-based schemes to speed up our implementation, with minimal impact on accuracy. Our results, for a number of IBM power grid benchmarks, confirm that Black's model is overly inaccurate. The lifetimes found using our physics-based approach are on average 3x longer than those based on a (calibrated) Black's model, such as currently used in industry. For the two largest IBM benchmarks (700K branches each), our runtime is comparable to that of the Black's based approach, requiring 3 hours for the largest grid.
Starting Page	1
Ending Page	8
Page Count	8
File Format	PDF
ISBN	9781450344661
DOI	10.1145/2966986.2967041
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2016-11-07
Publisher Place	New York
Access Restriction	Subscribed
Subject Keyword	Electromigration Power grids Reliability Hydrostatic stress
Content Type	Text
Resource Type	Article

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