NDLI: Probing local surface conductance using current sensing atomic force microscopy.

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Probing local surface conductance using current sensing atomic force microscopy.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	Liu, Yucong Zhu, Da-Ming He, Jiayu Kwon, Osung
Description	Country affiliation: United States Author Affiliation: Liu Y ( Department of Physics, University of Missouri-Kansas City, Kansas City, Missouri 64110, USA.)
Abstract	We have analyzed correlations between surface morphology and current sensing images obtained using a current sensing atomic force microscope (CSAFM) and the implication of surface conductivity derived from the current sensing images. We found that in cases where the diameter of a CSAFM probe tip is much smaller than the correlation length of the surface morphological features, the current detected using the probe should have little correlation with the surface features imaged by the same probe. If the sample thickness is much larger than the tip size, the surface conductivity distribution of a sample can be derived from a current sensing image using the Holm resistance relation, and the current probed using a CSAFM reflects the conductance variations in a layer on the surface with the thickness comparable to the probe diameter. However, if the thickness of a sample is comparable to or smaller than the tip diameter, CSAFM measures the conductance across the entire portion of the sample sandwiched between the tip and the electrode.
ISSN	00346748
Issue Number	1
Journal	Review of Scientific Instruments
Volume Number	83
e-ISSN	10897623
Language	English
Publisher	American Institute of Physics
Publisher Date	2012-01-01
Publisher Place	United States
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Discipline Physics Discipline Chemistry
Content Type	Text
Resource Type	Article
Subject	Medicine Instrumentation

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