NDLI: Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr0.45Ti0.55O3 thin films on silicon in relation to grain tilt

Please wait, while we are loading the content...

Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO2 heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies

Exchange coupling controlled ferrite with dual magnetic resonance and broad frequency bandwidth in microwave absorption

Nanoscale magneto-structural coupling in as-deposited and freestanding single-crystalline Fe7Pd3 ferromagnetic shape memory alloy thin films

Anisotropic mobility and carrier dynamics in the β-type BEDT-TTF salts as studied by inter-layer transverse magnetoresistance

Preparation of chitosan/mesoporous silica nanoparticle composite hydrogels for sustained co-delivery of biomacromolecules and small chemical drugs

Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr0.45Ti0.55O3 thin films on silicon in relation to grain tilt

Preparation of a hierarchically porous AlPO4 monolith via an epoxide-mediated sol–gel process accompanied by phase separation

Biosilicate®–gelatine bone scaffolds by the foam replica technique: development and characterization

Role of a disperse carbon interlayer on the performances of tandem a-Si solar cells

Bi-layered calcium phosphate cement-based composite scaffold mimicking natural bone structure

Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr0.45Ti0.55O3 thin films on silicon in relation to grain tilt

Content Provider	Taylor & Francis Online
Author	Dekkers, Matthijn Houwman, Evert P. Nguyen, Minh D. Rijnders, Guus
Abstract	Piezoelectric thin films of PbZr0.45Ti0.55O3 were grown on Si substrates in four different ways, resulting in different crystalline structures, as determined by x-ray analysis. The crystalline structures were different in the spread in tilt angle and the in-plane alignment of the crystal planes between different grains. It is found that the deviations of the ferroelectric polarization loop from that of the ideal rectangular loop (reduction of the remanent polarization with respect to the saturation polarization, dielectric constant of the film, slanting of the loop, coercive field value) all scale with the average tilt angle. A model is derived based on the assumption that the tilted grain boundaries between grains affect the film properties locally. This model describes the observed trends. The effective piezoelectric coefficient d33,eff shows also a weak dependence on the average tilt angle for films grown in a single layer, whereas it is strongly reduced for the films deposited in multiple layers. The least affected properties are obtained for the most epitaxial films, i.e. grown on a SrTiO3 epitaxial seed layer, by pulsed laser deposition. These films are intrinsically stable and do not require poling to acquire these stable properties.
File Format	PDF HTM / HTML
ISSN	14686996 18785514
DOI	10.1088/1468-6996/14/4/045006
Journal	Science and Technology of Advanced Materials
Volume Number	14
Issue Number	4
Language	English
Publisher	Taylor & Francis
Publisher Date	2013-07-30
Access Restriction	Open
Subject Keyword	10.1 20.11 30.1 Ferroelectric Piezoelectric Thin film Grain boundary PZT Stability Epitaxial
Content Type	Text
Resource Type	Article
Subject	Materials Science

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Epitaxial Stabilization of a Morphotropic Phase Boundary in Lead-Free Ferroelectric Thin Films

Nanoscale magneto-structural coupling in as-deposited and freestanding single-crystalline Fe7Pd3 ferromagnetic shape memory alloy thin films

Effect of electrically induced cracks on the properties of PZT thin film capacitors

Influence of surface features on the adhesion of Staphylococcus epidermidis to Ag–TiCN thin films

Thin-Film Piezoelectric-on-Silicon Resonant Transformers

Impact of la Concentration on Ferroelectricity of La-Doped HfO2Epitaxial Thin Films

Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Epitaxial PZT thin films on YSZ-buffered Si (001) substrates for piezoelectric MEMS or NEMS applications

Nanostructure engineering of epitaxial piezoelectric α-quartz thin films on silicon

Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr0.45Ti0.55O3 thin films on silicon in relation to grain tilt

Similar Documents

Epitaxial Stabilization of a Morphotropic Phase Boundary in Lead-Free Ferroelectric Thin Films

Nanoscale magneto-structural coupling in as-deposited and freestanding single-crystalline Fe7Pd3 ferromagnetic shape memory alloy thin films

Effect of electrically induced cracks on the properties of PZT thin film capacitors

Influence of surface features on the adhesion of Staphylococcus epidermidis to Ag–TiCN thin films

Thin-Film Piezoelectric-on-Silicon Resonant Transformers

Impact of la Concentration on Ferroelectricity of La-Doped HfO2Epitaxial Thin Films

Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Epitaxial PZT thin films on YSZ-buffered Si (001) substrates for piezoelectric MEMS or NEMS applications

Nanostructure engineering of epitaxial piezoelectric α-quartz thin films on silicon

Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr0.45Ti0.55O3 thin films on silicon in relation to grain tilt