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  1. Bulletin of the Russian Academy of Sciences: Physics
  2. Bulletin of the Russian Academy of Sciences: Physics : Volume 76
  3. Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 9, September 2012
  4. Investigation of silicon-on-sapphire structures by means of TEM
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Bulletin of the Russian Academy of Sciences: Physics : Volume 81
Bulletin of the Russian Academy of Sciences: Physics : Volume 80
Bulletin of the Russian Academy of Sciences: Physics : Volume 79
Bulletin of the Russian Academy of Sciences: Physics : Volume 78
Bulletin of the Russian Academy of Sciences: Physics : Volume 77
Bulletin of the Russian Academy of Sciences: Physics : Volume 76
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 12, December 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 11, November 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 10, October 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 9, September 2012
Reconstructing the energy spectra of backscattered electrons with allowance for the spectrometer’s response function
Automating the mode of the electron-probe control of templates for imprint lithography
Experimental cathodoluminescence studies of exciton transport in gallium nitride
Allowing for matrix effects in local electron-probe analysis using a new model of the distribution function for the depth of characteristic X-ray radiation
Prospects for using cathodoluminescence in SEM to study the distribution and types of breakdown in glass insulators
Precision depth profiling of nanoelectronic structures using secondary molecular ions in secondary-ion mass spectrometry
Analyzing SEM collection efficiency
Electron beam lithography with a Gaussian current distribution for nanolithography
Investigating the optical properties of a near-surface layer in silicon implanted by zinc after thermal annealing
Electron tomography and morphological analysis of the structure of multicomponent amorphous and nanocrystalline alloys
Investigation of silicon-on-sapphire structures by means of TEM
Studying the structure of nanocomposites obtained via the chemical decomposition of metal siloxanes in polymer matrices
Determining the young modulus of nanosize thickness coatings for MEMS from the results of static force spectroscopy
In-situ investigation of the structure of electrolitically deposited cobalt-phosporous alloy upon heating
Eliminating distortions of nonperiodic structures in images
Simulation and analysis of images using spectral characteristics
Characterizing the structure of Co/Cu and NiFe/Cu multilayered magnetic nanowires
Effect of electron irradiation on fluorides of alkali-earth elements (CaF$_{2}$, SrF$_{2}$ and BaF$_{2}$)
Cationic nonstoichiometry of oxides of the Ba-Cu-O and Y-Ba-Cu-O systems
Growth and properties of GaAs and GaN films and low-dimensional GaAs/QWsInGaAs structures on Si substrates with a Ge buffer layer
Studying the characteristics of the photosensitive elements of photodetector matrices based on Si Pt: Si by means of induced potential and transmission electron microscopy
Surface tension of melts of binary alkali element systems: The sodium-cesium system
Structural defects on a 1T-TiSe$_{2}$ surface: Experiment and model calculation of photoelectron diffraction
Features of the specific resistance of nanocomposite films fabricated from multiwall carbon tubes by means of a directed spinning chuck
Testing effective nucleon-nucleon forces to describe diagonal spin-transfer coefficients for the scattering of polarized protons with the excitation of the 1$^{+}$ levels in $^{12}$C
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 8, August 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 7, July 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 6, June 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 5, May 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 4, April 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 3, March 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 2, February 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 76, Issue 1, January 2012
Bulletin of the Russian Academy of Sciences: Physics : Volume 75
Bulletin of the Russian Academy of Sciences: Physics : Volume 74
Bulletin of the Russian Academy of Sciences: Physics : Volume 73
Bulletin of the Russian Academy of Sciences: Physics : Volume 72
Bulletin of the Russian Academy of Sciences: Physics : Volume 71

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Investigation of silicon-on-sapphire structures by means of TEM

Content Provider Springer Nature Link
Author Pavlov, D. A. Shilyaev, P. A. Korotkov, E. V. Krivulin, N. O. Bobrov, A. I.
Copyright Year 2012
Abstract The initial stages of the molecular beam epitaxy (MBE) growth of silicon-on-sapphire (SOS) are investigated via transmission electron microscopy (TEM). The sample preparation procedure is improved to study SOS structures by TEM. It is shown that silicon in the shape of 3D islets can form on a continuous silicon layer grown on sapphire.
Starting Page 1002
Ending Page 1004
Page Count 3
File Format PDF
ISSN 10628738
Journal Bulletin of the Russian Academy of Sciences: Physics
Volume Number 76
Issue Number 9
e-ISSN 19349432
Language English
Publisher Allerton Press, Inc.
Publisher Date 2012-09-28
Publisher Place Heidelberg
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Nuclear Physics, Heavy Ions, Hadrons
Content Type Text
Resource Type Article
Subject Physics and Astronomy
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