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| Content Provider | Springer Nature Link |
|---|---|
| Author | Reggente, Melania Rossi, Marco Angeloni, Livia Tamburri, Emanuela Lucci, Massimiliano Davoli, Ivan Terranova, Maria Letizia Passeri, Daniele |
| Copyright Year | 2015 |
| Abstract | Atomic force microscopy (AFM) is a versatile tool to perform mechanical characterization of surface samples at the nanoscale. In this work, we review two of such methods, namely contact resonance AFM (CR-AFM) and torsional harmonics AFM (TH-AFM). First, such techniques are illustrated and their applicability on materials with elastic moduli in different ranges are discussed, together with their main advantages and limitations. Then, a case study is presented in which we report the mechanical characterization using both CR-AFM and TH-AFM of polyaniline and polyaniniline doped with nanodiamond particles tablets prepared by a pressing process. We determined the indentation modulus values of their surfaces, which were found in fairly good agreement, thus demonstrating the accuracy of the techniques. Finally, the determined surface elastic moduli have been compared with the bulk ones measured through standard indentation testing. |
| Starting Page | 849 |
| Ending Page | 857 |
| Page Count | 9 |
| File Format | |
| ISSN | 10474838 |
| Journal | JOM |
| Volume Number | 67 |
| Issue Number | 4 |
| e-ISSN | 15431851 |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2015-03-06 |
| Publisher Institution | The Minerals, Metals & Materials Society (TMS) |
| Publisher Place | Boston |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Engineering Chemistry/Food Science Physics Environment Earth Sciences |
| Content Type | Text |
| Resource Type | Article |
| Subject | Engineering Materials Science |
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