NDLI: Solderability testing of Sn-Ag-XCu Pb-free solders on copper and Au-Ni-plated kovar substrates

Content Provider	Springer Nature Link
Author	Lopez, Edwin P. Vianco, Paul T. Rejent, Jerome A.
Copyright Year	2005
Abstract	Solderability was evaluated for four Pb-free alloys: 95.5Sn-4.3Ag-0.2Cu (wt.%), 95.5Sn-4.0Ag-0.5Cu, 95.5Sn-3.9Ag-0.6Cu, and 95.5Sn-3.8Ag-0.7Cu on oxygen-free electronic grade (OFE) Cu and Au-Ni plated Kovar substrates. The solderability metric was the contact angle, θ$_{c}$, as determined by the meniscometer/wetting balance technique. Tests were performed at 230°C, 245°C, and 260°C using rosin-based, mildly activated (RMA) flux, a rosin-based (R) flux, and a low-solids (LS) flux. The Pb-free solders exhibited acceptable to poor solderability (35°<θ$_{c}$<60°) on Cu with the RMA flux. Nonwetting occurred in most tests using the R flux. Wetting was observed with the LS flux, but only at 245°C and 260°C and with high contact angles. The solderability of the Pb-free solders improved at all test temperatures on the Au-Ni plated Kovar substrate when using the RMA flux (30°<θ$_{c}$<50°). Wetting was observed with the R flux (35°<θ$_{c}$<60°) and LS flux (50°<θ$_{c}$<85°) for all temperatures. The Pb-free solders had generally lower wetting rates and longer wetting times on Cu than the 63Sn-37Pb solder. The wetting rate and wetting time data were superior on the Au-Ni plated Kovar substrates. In general, solderability, as measured by θ$_{c}$ along with the wetting rate and wetting time, did not exhibit a consistent dependence on the composition of the Sn-Ag-XCu (X=0.2, 0.5, 0.6, and 0.7) alloys. The better performers were 95.5Sn-3.9Ag-0.6Cu alloy with the RMA flux (both Cu and Au-Ni plated Kovar) and 95.5Sn-3.8Ag-0.7Cu with the R and LS fluxes (Au-Ni-Kovar, only). The solder-flux interfacial tension, γ$_{LF}$, had a significant impact on the θ$_{c}$ values. The magnitudes of the contact angle θ$_{c}$ suggested that the four Pb-free solders would experience higher solderability defect counts at the printed wiring assembly level.
Starting Page	299
Ending Page	310
Page Count	12
File Format	PDF
ISSN	03615235
Journal	Journal of Electronic Materials
Volume Number	34
Issue Number	3
e-ISSN	1543186X
Language	English
Publisher	Springer-Verlag
Publisher Date	2005-01-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Pb-free solders Sn-Ag-XCu Cu substrates Kovar substrates Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics and Spectroscopy
Content Type	Text
Resource Type	Article
Subject	Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering

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