NDLI: Studies on Electrical and Magnetic Properties of Mg-Substituted Nickel Ferrites

Content Provider	Springer Nature Link
Author	Chavan, Pradeep Naik, L. R. Belavi, P. B. Chavan, Geeta Ramesha, C. K. Kotnala, R. K.
Copyright Year	2016
Abstract	The semiconducting polycrystalline ferrite materials with the general formula Ni$_{1−x }$Mg$_{ x }$Fe$_{2}$O$_{4}$ were synthesized by using the solid state reaction method. X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectrographs, and atomic force microscopy techniques were utilized to study the structural parameters. XRD confirms the formation of single phase cubic spinel structure of the ferrites. The crystallite sizes of ferrites determined using the Debye–Scherer formula ranges from 0.963 μm to 1.069 μm. The cation distribution of ferrite shows that Mg$^{2+}$ ions occupy a tetrahedral site (A-site) and the Ni$^{2+}$ ion occupy an octahedral site (B-site) whereas Fe$^{3+}$ ions occupies an octahedral as well as a tetrahedral site. The study of elastic parameters such as the longitudinal modulus, rigidity modulus, Young’s modulus, bulk modulus, and Debye temperature were estimated using the FTIR technique. The decrease of direct current (DC) resistivity with increase in temperature indicates the semiconducting nature of ferrites. The dielectric constant as well as loss tangent decreases with increase in frequency, and at still higher frequencies, they are almost constant. This shows usual dielectric dispersion behavior attributed to the Maxwell–Wagner type of interfacial polarization and is in accordance with Koop’s phenomenological theory. The linear increase of alternating current conductivity with increase of frequency shows the small polaron hopping type of conduction mechanism in all the ferrites. The magnetic properties such as saturation magnetization (M $_{ s }$), magnetic moment, coercivity, remnant magnetization (M $_{ r }$), and the ratio of M $_{ r }$ /M $_{ s }$ was estimated using the M–H loop.
Starting Page	188
Ending Page	198
Page Count	11
File Format	PDF
ISSN	03615235
Journal	Journal of Electronic Materials
Volume Number	46
Issue Number	1
e-ISSN	1543186X
Language	English
Publisher	Springer US
Publisher Date	2016-09-08
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Powder x-ray diffraction (XRD) atomic force microscopy (AFM) Fourier transform infrared (FTIR) spectrograph electrical resistivity Debye temperature Tauc plot vibrating sample magnetometer (VSM) and magnetic moment Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics
Content Type	Text
Resource Type	Article
Subject	Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering

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