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| Content Provider | Springer Nature Link |
|---|---|
| Author | Zhang, Xiaobo Shi, Qin Ren, Wei Zhou, Qing Lu, Hewei Bao, Shuai Wang, Lei Bian, Liang Xu, Jinbao Chang, Aimin |
| Copyright Year | 2017 |
| Abstract | Mn$_{1.56}$Co$_{0.96−x }$Ni$_{0.48}$Fe$_{ x }$O$_{4}$ series films have been fabricated on SiO$_{2}$/Si(100) substrates by chemical solution deposition and characterized by scanning electron microscopy, and their structural and mid-infrared (IR) properties investigated. The results indicate slight improvement in the microstructure and density of the films with increasing Fe content. The results of Raman spectroscopy showed variation in the local distortion and cation distribution at octahedral sites with elevated Fe content. The IR optical properties of the films were investigated at room temperature in the wavelength range from 1.5 μm to 25 μm. A strong absorption peak corresponding to Reststrahlen band located at 19.5 μm was observed and its absorption intensity found to improve with increasing Fe content in the films. The maximum absorption coefficient was calculated to be about 18,000 cm$^{−1}$. The results bear technological significance for the design and fabrication of devices for IR detection applications. |
| Starting Page | 5349 |
| Ending Page | 5355 |
| Page Count | 7 |
| File Format | |
| ISSN | 03615235 |
| Journal | Journal of Electronic Materials |
| Volume Number | 46 |
| Issue Number | 8 |
| e-ISSN | 1543186X |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2017-05-10 |
| Publisher Place | New York |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Thin film spinel optical absorption reststrahlen band Raman Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics |
| Content Type | Text |
| Resource Type | Article |
| Subject | Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering |
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