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  1. Journal of Electronic Materials
  2. Journal of Electronic Materials : Volume 29
  3. Journal of Electronic Materials : Volume 29, Issue 7, July 2000
  4. Foreword
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Journal of Electronic Materials : Volume 46
Journal of Electronic Materials : Volume 45
Journal of Electronic Materials : Volume 44
Journal of Electronic Materials : Volume 43
Journal of Electronic Materials : Volume 42
Journal of Electronic Materials : Volume 41
Journal of Electronic Materials : Volume 40
Journal of Electronic Materials : Volume 39
Journal of Electronic Materials : Volume 38
Journal of Electronic Materials : Volume 37
Journal of Electronic Materials : Volume 36
Journal of Electronic Materials : Volume 35
Journal of Electronic Materials : Volume 34
Journal of Electronic Materials : Volume 33
Journal of Electronic Materials : Volume 32
Journal of Electronic Materials : Volume 31
Journal of Electronic Materials : Volume 30
Journal of Electronic Materials : Volume 29
Journal of Electronic Materials : Volume 29, Issue 12, December 2000
Journal of Electronic Materials : Volume 29, Issue 11, November 2000
Journal of Electronic Materials : Volume 29, Issue 10, October 2000
Journal of Electronic Materials : Volume 29, Issue 9, September 2000
Journal of Electronic Materials : Volume 29, Issue 8, August 2000
Journal of Electronic Materials : Volume 29, Issue 7, July 2000
Identification of prismatic slip bands in 4H SiC boules grown by physical vapor transport
Foreword
The growth of GaN on lithium gallate (LiGaO$_{2}$) substrates for material integration
Compliant substrates: A comparative study of the relaxation mechanisms of strained films bonded to high and low viscosity oxides
Relaxation enhancing interlayers (REIs) in threading dislocation reduction
Comparison of GaAs grown on standard Si (511) and compliant SOI (511)
Room temperature wafer bonding of silicon, oxidized silicon, and crystalline quartz
Transfer of n-type GaSb onto GaAs substrate by hydrogen implantation and wafer bonding
SiGe MOSFET structures on silicon-on-sapphire substrates grown by ultra-high vacuum chemical vapor deposition
Transfer of semiconductor and oxide films by wafer bonding and layer cutting
Lattice-mismatched InGaAs layers grown by OMVPE on GaAs based compliant substrates
Comparison of InGaSb/InAs superlattice structures grown by MBE on GaSb, GaAs, and compliant GaAs substrates
Strain relaxation in InGaAs lattice engineered substrates
Low-dislocation relaxed SiGe grown on an effective compliant substrate
Engineering phase formation thermo-chemistry for crystal growth of homogeneous ternary and quaternary III–V compound semiconductors from melts
Pd/Sb(Zn) and Pd/Ge(Zn) ohmic contacts on p-type indium gallium arsenide: The employment of the solid phase regrowth principle to achieve optimum electrical and metallurgical properties
Er-doped polycrystalline silicon for light emission at λ=1.54 µm
Complex permeability studies of Li$^{1+}$ substituted Cu-Zn ferrites
Optimum antireflection coatings for heteroface AlGaAs/GaAs solar cells—Part I: The influence of window layer oxidation
Optimum antireflection coatings for heteroface AlGaAs/GaAs solar cells—Part II: The influence of uncertainties in the parameters of window and antireflection coatings
Journal of Electronic Materials : Volume 29, Issue 6, June 2000
Journal of Electronic Materials : Volume 29, Issue 5, May 2000
Journal of Electronic Materials : Volume 29, Issue 4, April 2000
Journal of Electronic Materials : Volume 29, Issue 3, March 2000
Journal of Electronic Materials : Volume 29, Issue 2, February 2000
Journal of Electronic Materials : Volume 29, Issue 1, January 2000
Journal of Electronic Materials : Volume 28
Journal of Electronic Materials : Volume 27
Journal of Electronic Materials : Volume 26

Foreword

Content Provider Springer Nature Link
Author Seaford, Matthew L.
Copyright Year 2000
Starting Page 893
Ending Page 893
Page Count 1
File Format PDF
ISSN 03615235
Journal Journal of Electronic Materials
Volume Number 29
Issue Number 7
e-ISSN 1543186X
Language English
Publisher Springer-Verlag
Publisher Date 2000-01-01
Publisher Place New York
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics and Spectroscopy
Content Type Text
Subject Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering
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