NDLI: Study on delayed cracking of conductive notch under electric field in PZT-5H ferroelectric ceramics

Content Provider	Springer Nature Link
Author	Qiao, Guangli Su, Yanjing Qiao, Lijie Chu, Wuyang
Copyright Year	2006
Abstract	Electric-field-induced delay cracking of conducting notch in PZT-5H ferroelectric ceramics has been studied using a compact specimen with a notch filled in conductive silver paste. The critical electric field that induces instant failure of the PZT-5H specimen is shown to be E $_{F}$ = 14.7±3.2 kV/cm. When an electric field lower than E $_{F}$, but higher than E $_{DF}$ = 9.9 kV/cm was applied, a micro-crack formed at the conductive notch tip instantly, propagating slowly until the specimen failure. When the electric field was lower than E $_{DF}$, the micro-crack propagated a short distance, and then stopped. When the electric field was lower than E $_{K}$ = 4.9 kV/cm, no cracks formed at the conductive notch tip instantly, however, a delay micro-crack would form and propagate. When the electric field was lower than E $_{DK}$=2.4 kV/cm, no cracks formed and delay propagation occurred. A model for electric charge emission and concentration at a conductive notch is proposed to explain the delay cracking of conducting notch.
Starting Page	2146
Ending Page	2149
Page Count	4
File Format	PDF
ISSN	10016538
Journal	Chinese Science Bulletin
Volume Number	51
Issue Number	17
e-ISSN	18619541
Language	English
Publisher	Science in China Press
Publisher Date	2006-01-01
Publisher Place	Beijing
Access Restriction	Subscribed
Subject Keyword	PZT ferroelectric ceramics conductive notch electrical fracture electric-field-induced-delayed fracture Science Chemistry/Food Science Geosciences Life Sciences Physics Engineering
Content Type	Text
Resource Type	Article
Subject	Multidisciplinary

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