NDLI: Effect of Thin Films on Dynamic Performance of Resonating MEMS

Content Provider	Springer Nature Link
Author	Pryputniewicz, R. J.
Copyright Year	2013
Abstract	Continued advances in microelectromechanical systems (MEMS) technology have led to development of a multitude of new sensors and their corresponding advanced applications. Great many of these sensors (e.g., microgyroscopes, accelerometers, biological, chemical, security, medical, etc.) rely on either sensing elements or elastic suspensions that resonate. Regardless of their applications, sensors are always designed to provide the most exact responses to the signals they are developed to detect and/or monitor. One way to quantify this exactness is to use the Quality factor (Q-factor). MEMS sensors are typically fabricated out of materials that are mechanically sound at the microscale, but can be relatively poor electrical conductors. For this reason, areas of MEMS are coated with various thin metal films to provide electrical pathways. These films, however, adversely alter resonant properties of a device. To facilitate our study, microcantilever configurations were selected to test influence that thin metal films have on resonators. This paper reviews a theoretical analysis of the effect that thermoelastic internal friction has on the Q-factor of microscale resonators and shows that the internal friction relating to TED is a fundamental damping mechanism in determination of quality of high-Q resonators over a range of operating conditions. Using silicon microcantilevers coated with aluminum films from 5 nm to 30 nm thick, on one as well as both sides, Q-factors were experimentally determined using the ring-down method. From the ring-down curve, the Q-factor of each microcantilever was determined. Experimental results show that as thickness of the aluminum film increases, Q-factor of the device decreases. Comparison of analytical and experimental results indicates good correlation, well within the limits based on uncertainty analysis. In addition, preliminary results also show a significant temperature dependence of the Q-factor of aluminum coated microcantilevers.
Starting Page	25
Ending Page	33
Page Count	9
File Format	PDF
ISSN	00144851
Journal	Experimental Mechanics
Volume Number	54
Issue Number	1
e-ISSN	17412765
Language	English
Publisher	Springer US
Publisher Date	2013-10-24
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	MEMS Microcantilever High-frequency Thin films Ring-down Quality factor Uncertainty analysis TED Resonance Continuum Mechanics and Mechanics of Materials Characterization and Evaluation of Materials Optics, Optoelectronics, Plasmonics and Optical Devices Structural Mechanics Vibration, Dynamical Systems, Control Mechanics
Content Type	Text
Resource Type	Article
Subject	Mechanics of Materials Mechanical Engineering Aerospace Engineering

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