NDLI: Patent citation indicators: One size fits all?

Content Provider	Springer Nature Link
Author	Verhoeven, Dennis Bakker, Jurriën Van Looy, Bart Zhang, Lin
Copyright Year	2015
Abstract	The number of citations that a patent receives is considered an important indicator of the quality and impact of the patent. However, a variety of methods and data sources can be used to calculate this measure. This paper evaluates similarities between citation indicators that differ in terms of (a) the patent office where the focal patent application is filed; (b) whether citations from offices other than that of the application office are considered; and (c) whether the presence of patent families is taken into account. We analyze the correlations between these different indicators and the overlap between patents identified as highly cited by the various measures. Our findings reveal that the citation indicators obtained differ substantially. Favoring one way of calculating a citation indicator over another has non-trivial consequences and, hence, should be given explicit consideration. Correcting for patent families, especially when using a broader definition (INPADOC), provides the most uniform results.
Ending Page	211
Page Count	25
Starting Page	187
File Format	PDF
ISSN	01389130
e-ISSN	15882861
Journal	Scientometrics
Issue Number	1
Volume Number	106
Language	English
Publisher	Springer Netherlands
Publisher Date	2015-11-02
Publisher Place	Dordrecht
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	PCT Patent family Classification and discrimination; cluster analysis EPO Measures of association (correlation, canonical correlation, etc.) Information Storage and Retrieval Factor analysis and principal components; correspondence analysis Patent citations USPTO Library Science Multivariate analysis
Content Type	Text
Resource Type	Article
Subject	Library and Information Sciences Computer Science Applications

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Comparison of US, EPO, and PCT Patent Citations for Citation Analysis

Benchmarking regional innovative performance: composite measures and direct innovation counts

Multivariate data analysis: The French way

Interpreting correlations between citation counts and other indicators

Comparison of examiners’ forward citations in the United States and Japan with pairs of equivalent patent applications

Have Chinese firms learned from their prior technology in-licensing? An analysis based on patent citations

Analysis of the relationship between citation frequency of patents and diversity of their backward citations for Japanese patents

Can applied science be ‘good science’? Exploring the relationship between patent citations and citation impact in nanoscience

The 'home advantage' effect and patent families. A comparison of OECD triadic patents, the USPTO and the EPO

Patent citation indicators: One size fits all?

Similar Documents

Comparison of US, EPO, and PCT Patent Citations for Citation Analysis

Benchmarking regional innovative performance: composite measures and direct innovation counts

Multivariate data analysis: The French way

Interpreting correlations between citation counts and other indicators

Comparison of examiners’ forward citations in the United States and Japan with pairs of equivalent patent applications

Have Chinese firms learned from their prior technology in-licensing? An analysis based on patent citations

Analysis of the relationship between citation frequency of patents and diversity of their backward citations for Japanese patents

Can applied science be ‘good science’? Exploring the relationship between patent citations and citation impact in nanoscience

The 'home advantage' effect and patent families. A comparison of OECD triadic patents, the USPTO and the EPO

Patent citation indicators: One size fits all?