NDLI: Syndrome measurement strategies for the [[7,1,3]] code

Content Provider	Springer Nature Link
Author	Weinstein, Yaakov S.
Copyright Year	2015
Abstract	Quantum error correction (QEC) entails the encoding of quantum information into a QEC code space, measuring error syndromes to properly locate and identify errors, and, if necessary, applying a proper recovery operation. Here we compare three syndrome measurement protocols for the [[7,1,3]] QEC code: Shor states, Steane states, and one ancilla qubit by simulating the implementation of 50 logical gates with the syndrome measurements interspersed between the gates at different intervals. We then compare the fidelities for the different syndrome measurement types. Our simulations show that the optimal syndrome measurement strategy is generally not to apply syndrome measurements after every gate but depends on the details of the error environment. Our simulations also allow a quantum computer programmer to weigh computational accuracy versus resource consumption (time and number of qubits) for a particular error environment. In addition, we show that applying syndrome measurements that are unnecessary from the standpoint of quantum fault tolerance may be helpful in achieving better accuracy or in lowering resource consumption. Finally, our simulations demonstrate that the single-qubit non-fault-tolerant syndrome measurement strategy achieves comparable fidelity to those that are fault tolerant.
Starting Page	1841
Ending Page	1854
Page Count	14
File Format	PDF
ISSN	15700755
Journal	Quantum Information Processing
Volume Number	14
Issue Number	6
e-ISSN	15731332
Language	English
Publisher	Springer US
Publisher Date	2015-04-19
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Quantum error correction Quantum fault tolerance Syndrome measurements Quantum Information Technology, Spintronics Quantum Computing Data Structures, Cryptology and Information Theory Quantum Physics Mathematical Physics
Content Type	Text
Resource Type	Article
Subject	Statistical and Nonlinear Physics Theoretical Computer Science Signal Processing Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering Modeling and Simulation

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