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| Content Provider | Springer Nature Link |
|---|---|
| Author | Avni, R. Miralaï, S. F. Prevot, F. Morvan, D. Amoroux, J. Nickel, H. |
| Copyright Year | 1997 |
| Abstract | The diagnostics of the radio-frequency (induction mode) plasma expanded through a nozzle (PETN) at low pressures (100–1000 Pa) was performed by on-line optical emission spectroscopy (OES) and on line quadrupole mass spectrometry (QMS). The OES was used for evaluating the electronic, vibrational, and rotational temperatures (T$_{e}$, T$_{v}$, and T$_{r}$) along the plasma reactor before and after the nozzle. The PETN gas mixtures analyzed were Ar+N$_{2}$, Ar+CO, and Ar+O$_{2}$with an addition of 1 vol.% N$_{2}$to the last two gas mixtures. For the same conditions in the PETN the values of T$_{e}$, T$_{v}$, and T$_{r}$ were found to be different for the different gas mixtures and related to the depopulation of excited N 2 + by oxygen atoms. Moreover the Ar+O$_{2}$PETN aqueous solutions of lanthanum and manganese nitrates were nebulized for the deposition of LaMnO$_{3}$perovskite. The QMS, in real time, measuring the mass species formed before and after the nozzle, explained the reasons in the different values of T$_{e}$, T$_{v}$, and T$_{r}$ for the three gas mixtures as well as for the formation of oxides in the PETN from the aqueous nitrate solutions. |
| Starting Page | 467 |
| Ending Page | 478 |
| Page Count | 12 |
| File Format | |
| ISSN | 02724324 |
| Journal | Plasma Chemistry and Plasma Processing |
| Volume Number | 17 |
| Issue Number | 4 |
| e-ISSN | 15728986 |
| Language | English |
| Publisher | Kluwer Academic Publishers-Plenum Publishers |
| Publisher Date | 1997-01-01 |
| Publisher Place | New York |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Inorganic Chemistry Characterization and Evaluation Materials Mechanics Nuclear Physics, Heavy Ions, Hadrons Mechanical Engineering |
| Content Type | Text |
| Resource Type | Article |
| Subject | Chemistry Surfaces, Coatings and Films Condensed Matter Physics Chemical Engineering |
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