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  1. Journal of Materials Science: Materials in Electronics
  2. Journal of Materials Science: Materials in Electronics : Volume 16
  3. Journal of Materials Science: Materials in Electronics : Volume 16, Issue 6, June 2005
  4. Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders
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Journal of Materials Science: Materials in Electronics : Volume 28
Journal of Materials Science: Materials in Electronics : Volume 27
Journal of Materials Science: Materials in Electronics : Volume 26
Journal of Materials Science: Materials in Electronics : Volume 25
Journal of Materials Science: Materials in Electronics : Volume 24
Journal of Materials Science: Materials in Electronics : Volume 23
Journal of Materials Science: Materials in Electronics : Volume 22
Journal of Materials Science: Materials in Electronics : Volume 21
Journal of Materials Science: Materials in Electronics : Volume 20
Journal of Materials Science: Materials in Electronics : Volume 19
Journal of Materials Science: Materials in Electronics : Volume 18
Journal of Materials Science: Materials in Electronics : Volume 17
Journal of Materials Science: Materials in Electronics : Volume 16
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 11-12, November 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 10, October 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 9, September 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 8, August 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 7, July 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 6, June 2005
Plasma parameters and volume kinetics in Cl$_{2}$/O$_{2}$ mixtures
Magnetic studies of spin wave excitations in Fe/Pt multilayers
Synthesis, characterization and temperature studies on the conductivity of AlCl$^{−}$$_{4}$ ion doped polypyrrole
Microstructural, dielectric, impedance and electric modulus studies on vanadium—doped and pure strontium bismuth niobate (SrBi$_{2}$Nb$_{2}$O$_{9}$) ceramics
Effect of La$_{2}$O$_{3}$ addition on microstructure and electrical properties of ZnO-Pr$_{6}$O$_{11}$-based varistor ceramics
Low temperature electrical conductivity of low-density polyethylene/carbon black composites
Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders
Investigation of structural properties of amorphous carbon nitride thin films prepared by xenon cloride pulsed laser deposition of camphoric carbon precursor
Densification, mechanical and microstructure properties of β-spodumene—alumina composites
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 5, May 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 4, April 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 3, March 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 2, February 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 1, January 2005
Journal of Materials Science: Materials in Electronics : Volume 15
Journal of Materials Science: Materials in Electronics : Volume 14
Journal of Materials Science: Materials in Electronics : Volume 13
Journal of Materials Science: Materials in Electronics : Volume 12
Journal of Materials Science: Materials in Electronics : Volume 11
Journal of Materials Science: Materials in Electronics : Volume 10
Journal of Materials Science: Materials in Electronics : Volume 9
Journal of Materials Science: Materials in Electronics : Volume 8

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Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders

Content Provider Springer Nature Link
Author Lin, Chih Kuang Chu, De You
Copyright Year 2005
Abstract The aim of this study is to investigate the creep rupture behavior of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders at three temperatures ranging from room temperature (RT) to 90 °C, under a tensile stress range of σ/E=10$^{−4}$ to 10$^{−3}$. The ultimate tensile strength (UTS) and creep resistance were found to be decreased with increasing temperature for each given lead-free solder. Both the binary and ternary Ag-containing alloys exhibited superior UTS and creep strength to the conventional Sn-37Pb solder at a similar temperature. Due to a more uniform distribution of eutectic phases and a larger volume fraction of intermetallic compounds (IMCs), the Sn-3.5Ag-0.5Cu alloy had greater UTS and creep strength than did the eutectic Sn-3.5Ag solder at each testing temperature. The stress exponents (n) of minimum strain rate (˙ε$_{min}$) were decreased from 7 and 9 at RT to 5 and 6 at 60 and 90 °C, for the binary and ternary lead-free alloys, respectively. Fractography analyses revealed typical rupture by the nucleation and growth of voids/microcracks at IMCs on the grain boundaries. Both Monkman-Grant and Larson-Miller relationships showed good results in estimating the rupture times under various combinations of applied stress and temperature. A model, using a term of applied stress normalized by Young’s modulus, was proposed to correlate the rupture times at various temperatures and could explain the rupture time data reasonably well for the given two lead-free solders.
Starting Page 355
Ending Page 365
Page Count 11
File Format PDF
ISSN 09574522
Journal Journal of Materials Science: Materials in Electronics
Volume Number 16
Issue Number 6
e-ISSN 1573482X
Language English
Publisher Kluwer Academic Publishers
Publisher Date 2005-01-01
Publisher Place Boston
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Optical and Electronic Materials Characterization and Evaluation Materials
Content Type Text
Resource Type Article
Subject Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering
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