NDLI: Physics-Based Low-Cost Test Technique for High Voltage LDMOS

Content Provider	Springer Nature Link
Author	Kannan, Sukeshwar Kannan, Kaushal Kim, Bruce C. Taenzler, Friedrich Antley, Richard Moushegian, Ken Butler, Kenneth M. Mirizzi, Doug
Copyright Year	2013
Abstract	This paper presents a low-cost test technique for testing high-voltage laterally diffused metal oxide semiconductor field effect transistor (HV-LDMOS) to identify structural defects such as gate-FOX breakdown, post breakdown thermal stress and drain leakage due to high voltages. A novel highly accurate hybrid MOS-p model for HV-LDMOS was developed and validated across various device geometries including both long and small gate-channels. Structural defects in HV-LDMOS were modeled and their physical effect was induced in the hybrid MOS-p model to develop fault models. These fault models were used for parametric testing and diagnosis of HV-LDMOS. A novel test technique using a noise-reduction scheme to test HV-LDMOS is presented in this paper. Test simulations were performed on a MOSFET driver IC with a 700 V LDMOS and experimental validation was performed by building a prototype test setup and making hardware measurements for breakdown and leakage tests. This test technique overcomes the test challenges pertaining to power supply and tester system noise, and provides a superior signal-to-noise ratio (SNR) when compared to conventional test methods. The noise-reduction scheme is inexpensive and highly accurate. The fault-model based test approach reduces the test suite for HV-LDMOS to a couple of test measurements which reduces the overall test cost and time.
Starting Page	745
Ending Page	762
Page Count	18
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	29
Issue Number	6
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2013-11-15
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	High-Voltage Laterally Diffused MOS (HV-LDMOS) Noise-reduction scheme Fault modeling Structural defects Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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