NDLI: Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation

Content Provider	Springer Nature Link
Author	Subrahmaniyan Radhakrishnan, Gurusubrahmaniyan Ozev, Sule
Copyright Year	2011
Abstract	In this paper, we propose a methodology for adaptive modeling of analog/RF circuits. This modeling technique is specifically geared towards evaluating the response of a faulty circuit in terms of its specifications and/or measurements. The goal of this modeling approach is to compute important test metrics, such as fail probability, fault coverage, and/or yield coverage of a given measurement under process variations. Once the models for the faulty and fault-free circuit are generated, we can simply use Monte-Carlo sampling (as opposed to Monte-Carlo simulations) to compute these statistical parameters with high accuracy. We use the error budget that is defined in terms of computing the statistical metrics and the position of the threshold(s) to decide how precisely we need to extract the necessary models. Experiments on LNA and Mixer confirm that the proposed techniques can reduce the number of necessary simulations by factor of 7 respectively, in the computation of the fail probability.
Starting Page	465
Ending Page	476
Page Count	12
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	27
Issue Number	4
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2011-04-12
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Fault modeling Robust regression Analog/RF circuits Simulation reduction Test statistics computation Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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