NDLI: Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

Content Provider	Springer Nature Link
Author	Harutunyan, G. Vardanian, V. A. Zorian, Y.
Copyright Year	2007
Abstract	The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of Random Access Memories (RAM) with significant impact on defect-per-million (DPM) levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N is the number of memory cells, for subclasses of two-operation single-cell and two-cell dynamic faults, respectively, were proposed recently [Benso et al., Proc., ITC 2005] improving the length of the corresponding tests proposed earlier [Hamdioui et al., Proc. of IEEE VLSI Test Symposium, pp. 395–400, 2002]. Also, a March test of length 100N was proposed [Benso et al., Proc. ETS 2005, Tallinn, pp. 122–127, 2005] for detection of two-cell dynamic faults with two fault-sensitizing operations both applied on the victim or aggressor cells. In this paper, for the first time, March test algorithms of minimum length are proposed for two-operation single-cell and two-cell dynamic faults. In particular, the previously known March test algorithm of length 100N for detection of two-operation two-cell dynamic faults is improved by 30N.
Starting Page	55
Ending Page	74
Page Count	20
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	23
Issue Number	1
e-ISSN	15730727
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2007-02-06
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	random access memories dynamic fault primitives dynamic functional fault models march test algorithms fault detection Circuits and Systems Electronic and Computer Engineering Computer-Aided Engineering (CAD, CAE) and Design
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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