NDLI: Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs

Content Provider	Springer Nature Link
Author	Ayadi, R. M. Masmoudi, M.
Copyright Year	2010
Abstract	Analog and mixed-signal testing is becoming an important issue that affects both the time-to-market and the product cost of many SoCs. In order to provide an efficient testing method for 865–870 MHz low noise amplifiers (LNAs), which constitute a mixed-signal circuit, a novel BIST method is developed. This BIST can be easily implemented with a RF peak detector and two comparators. The circuit used in the test and the LNA are designed using 0.35 µm CMOS technology. The simulation results show higher fault coverage than that of previous test methods. A total of twenty eight short and open (catastrophic) faults and eleven variation parameters have been introduced into the LNA, giving fault coverage of 100% for catastrophic faults and parametric variation. Thus, it provides an efficient structural test, which is suitable for a production test in terms of an area overhead, a test accessibility, and test time.
Starting Page	37
Ending Page	45
Page Count	9
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	26
Issue Number	1
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2010-01-19
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Built-in self test (BIST) Low noise amplifiers (LNA) Fault model Fault coverage Computer-Aided Engineering (CAD, CAE) and Design Electrical Engineering Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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