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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yen-Chih Huang Hsieh-Hung Hsieh Liang-Hung Lu |
| Copyright Year | 1963 |
| Abstract | A built-in self-test (BIST) technique suitable for RF low-noise amplifiers (LNAs) is presented in this paper. With fully integrated amplitude detectors and logarithmic amplifiers, the BIST module can be employed as a generic platform for gain extraction of the device-under-test (DUT) without expensive testing instruments, while maintaining a reasonable hardware overhead and minimum loading effects to the DUT. Using a 0.18-mum CMOS process, a 5-GHz variable-gain LNA with the proposed BIST module is implemented. Based on the experimental results, on-chip gain extraction of the LNA has been demonstrated with an error less than 1 dB for various gain modes. The additional chip area required for the BIST functionality measures 0.042 mm2, which is considerably small compared with the physical size of the RF amplifiers. |
| Sponsorship | IEEE Microwave Theory and Techniques Society |
| Starting Page | 1035 |
| Ending Page | 1042 |
| Page Count | 8 |
| File Size | 649191 |
| File Format | |
| ISSN | 00189480 |
| Volume Number | 56 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-05-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Built-in self-test Radio frequency Low-noise amplifiers Radiofrequency amplifiers Detectors Testing Instruments Hardware CMOS process Gain RF testing Amplitude detectors built-in self-test (BIST) logarithmic amplifiers low-noise amplifiers (LNAs) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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