Loading...
Please wait, while we are loading the content...
Similar Documents
Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
| Content Provider | Semantic Scholar |
|---|---|
| Author | Chen, Lang Wang, Jieqiang Boey, Freddy Yin Chiang |
| Copyright Year | 2008 |
| Abstract | A “misfit strain-temperature” phase diagram for BiFeO3 thin film was constructed based on the Landau–Devonshire theory with the mechanical substrate effect. It is found that the polarization instabilities result in the formation of the monoclinic phases in BiFeO3 thin films. The effective substrate lattice parameter has been introduced to calculate the film thickness dependence of the polarization and the dielectric constants. The theoretical results are in agreement with the experimental data for the thickness dependence of ferroelectric properties of the BiFeO3 epitaxial thin films on SrTiO3 and Si substrates. |
| Starting Page | 182902 |
| Ending Page | 182902 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.2920192 |
| Volume Number | 92 |
| Alternate Webpage(s) | https://dr.ntu.edu.sg/bitstream/10356/91520/1/34.%20Strain%20effects%20and%20thickness%20dependence%20of%20ferroelectric%20properties%20in%20epitaxial%20BiFeO3%20thin%20films.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.2920192 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
