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Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films
| Content Provider | Semantic Scholar |
|---|---|
| Author | Alpay, S. Pamir Roytburd, Alexander L. |
| Copyright Year | 2000 |
| Abstract | Ferroelectric or ferroelastic epitaxial films undergoing a cubic-to-tetragonal phase transformation usually relax the resultant strain energy due to lattice misfit by forming a polytwin (polydomain) structure. Polydomain formation occurs at the expense of building interdomain interfaces and microstresses which develop at the film-substrate interface due to the periodic deviation of the strain. The interplay between these components results in a critical thickness for domain formation below which the polydomain structure is not stable. In this article, we investigate the film thickness dependence of a polydomain structure using a thermodynamical approach. |
| Starting Page | 85 |
| Ending Page | 92 |
| Page Count | 8 |
| File Format | PDF HTM / HTML |
| Volume Number | 24 |
| Alternate Webpage(s) | http://journals.tubitak.gov.tr/physics/issues/fiz-00-24-2/fiz-24-2-2-98053.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |