Loading...
Please wait, while we are loading the content...
Similar Documents
At-wavelength characterization of refractive x-ray lenses using a two-dimensional grating interferometer
| Content Provider | Semantic Scholar |
|---|---|
| Author | Rutishauser, Simon Zanette, Irene Weitkamp, Timm Donath, Tilman David, Christian |
| Copyright Year | 2011 |
| Abstract | We report on the application of a two-dimensional hard x-ray grating interferometer to x-ray optics metrology. The interferometer is sensitive to refraction angles in two perpendicular directions with a precision of 10 nrad. It is used to observe the wavefront changes induced by a single parabolic beryllium focusing lens of large radius of curvature. The lens shape is reconstructed and its residual aberrations are analyzed. Its profile differs from an ideal parabolic shape by less than 2 lm or k/50 at k1⁄4 0.54 Å wavelength. VC 2011 American Institute of Physics. [doi:10.1063/1.3665063] |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.psi.ch/lmn/MetrologyEN/sRutishauser2011c.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Beryllium Diagnostic radiologic examination Lens (device) Less Than Optics Parabolic antenna Quantum metrology Views:Finding:Point in time:To be specified in another part of the message:Narrative:XR wavelength |
| Content Type | Text |
| Resource Type | Article |