Loading...
Please wait, while we are loading the content...
Similar Documents
Wavefront metrology measurements at SACLA by means of X-ray grating interferometry.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kayser, Yves Rutishauser, Simon Katayama, Tetsuo Ohashi, Haruhiko Kameshima, Takashi Spielmann, Sibylle Yabashi, Makina David, Christian |
| Copyright Year | 2014 |
| Abstract | The knowledge of the X-ray wavefront is of importance for many experiments at synchrotron sources and hard X-ray free-electron lasers. We will report on metrology measurements performed at the SACLA X-ray Free Electron Laser by means of grating interferometry which allows for an at-wavelength, in-situ, and single-shot characterization of the X-ray wavefront. At SACLA the grating interferometry technique was used for the study of the X-ray optics installed upstream of the end station, two off-set mirror systems and a double crystal monochromator. The excellent quality of the optical components was confirmed by the experimental results. Consequently grating interferometry presents the ability to support further technical progresses in X-ray mirror manufacturing and mounting. |
| Starting Page | 14414 |
| Ending Page | 14420 |
| Page Count | 7 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.elettra.trieste.it/events/2013/MEADOW/uploads/Main/Kayser_MEADOW2013.pdf |
| PubMed reference number | 24787789v1 |
| Alternate Webpage(s) | https://doi.org/10.1364/OE.22.009004 |
| DOI | 10.1364/oe.22.009004 |
| Journal | Optics express |
| Volume Number | 22 |
| Issue Number | 8 |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Diagnostic radiologic examination Interferometry Lasers Optical Devices Optics Synchrotrons Views:Finding:Point in time:To be specified in another part of the message:Narrative:XR wavelength |
| Content Type | Text |
| Resource Type | Article |
