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characterization of synthetic quartz crystals grown oncylindrical seeds logg in X, Y and Z directions by the X-ray topography.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Hideki, Shinohara Armando Sugiyama, Kazumasa |
| Copyright Year | 2004 |
| Abstract | Synthetic quartz crystals for quartz resonators production are usually grown on seeds such as Y-bar or Z-plate along in Y-direction. Y-cut plate of such synthetic crystals shows six distinct growth regions of +X, -X, two Z and two S regions. For quartz resonator fabrication, Z-growth regions are favored due to higher purity and lower amount of defects such as dislocations. It is known that the amount of growth regions in such synthetic quartz crystals depends on the growth conditions, but essentially of seed geometry. If a cylindrical seed is employed for the crystal growth, all growth regions, which grow perpendicularly to the seed axis, may be observed. This information will help us to realize the most optimized seed and growth condition. In this context, specimens of synthetic quartz crystals grown on cylindrical seeds long in X, Y and Z directions were investigated by the X-ray topography technique. A total of six synthetic quartz crystals grown on cylindrical seeds with 18 mm in diameter and 20 mm long in X, Y and Z directions were investigated by the X-ray topography technique. The cylindrical seeds were prepared by the ultrasonic machining from a synthetic quartz crystal with 150 dislocations/cm, and corresponding growth was conducted in an autoclave for commercial production at Nihon Denpa Kogyo, Japan. Specimens were cut perpendicularly to respective seed axis using a diamond saw, and the thickness was adjusted to have 300 to 350 μm to get a better image contrast due to the intermediate kinematical and dynamical diffractions. To avoid residual tensions due to sawing and lapping processes, the specimens were etched in a HF solution for 30 min. at room temperature. Xray topographic imaging was conducted by a high precision Lang camera with CuKα1 X-ray beam generated by a rotating anode with an ultrafine focus of 70 μm x 70 μm operated at 40 kV x 20 mA. The distance of X-ray source from the specimen is 110 cm. This configuration gives the geometrical resolution better than 10 μm. X-ray topographic images were collected with high resolution X-ray film (IX100: Fuji Film). The cylindrical seeds have all the growth faces parallel to the X, Y and Z-axis and only a few growth regions have been observed. Nevertheless, new growth regions almost free of dislocation were realized in the sample grown on the seeds long in X and Y directions, in particular. Therefore, authors maintain the view that the present new seeds can be designed to produce crystals almost free dislocation in near future. |
| Starting Page | 48 |
| Ending Page | 48 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.14824/kobutsu.2004.0.48.0 |
| Alternate Webpage(s) | https://www.jstage.jst.go.jp/article/kobutsu/2004/0/2004_0_48/_pdf/-char/ja |
| Alternate Webpage(s) | https://doi.org/10.14824/kobutsu.2004.0.48.0 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
