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Robust system design with built-in soft-error resilience
| Content Provider | Semantic Scholar |
|---|---|
| Author | Mitra, S. Seifert, Nils Zhang, M. Shi, Qingquan Kim, Kyung-Shik |
| Copyright Year | 2005 |
| Abstract | Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors. |
| Starting Page | 43 |
| Ending Page | 52 |
| Page Count | 10 |
| File Format | PDF HTM / HTML |
| DOI | 10.1109/MC.2005.70 |
| Volume Number | 38 |
| Alternate Webpage(s) | http://www.eng.auburn.edu/~agrawvd/COURSE/E7770_Spr07/READ/01401773.pdf |
| Alternate Webpage(s) | http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr07/READ/01401773.pdf |
| Alternate Webpage(s) | http://www1.cs.columbia.edu/~cs4823/handouts/handout29.pdf |
| Alternate Webpage(s) | https://doi.org/10.1109/MC.2005.70 |
| Journal | Computer |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |